WIW
within-wafer
PMOS
p-type metal oxide semiconductor
NMOS
n-type metal oxide semiconductor
BPSG
borophosphosilicate glass
BPTEOS
borophosphorous tetraethylorthosilicate
LDIMS
laser desorption ionization mass spectrum
SAMT
self-assembled multilayer
PTAA
polytriarylamine
SC
semiconductor
GD
gate dielectric
Friday, August 20, 2010
Thursday, August 19, 2010
New 10 terms
MOL
middle of the line
STI
shallow trench isolation
ILD
interlevel dielectric
UTSOI
ultrathin silicon-on-insulator
ETSOI
extremely thin silicon-on-insulator
LSOI
local silicon-on-insulator
RMG
replacement metal gate
MuGFET
multigate field effect transistor
LPCVD
low-pressure chemical vapor deposition
WID
within-die
middle of the line
STI
shallow trench isolation
ILD
interlevel dielectric
UTSOI
ultrathin silicon-on-insulator
ETSOI
extremely thin silicon-on-insulator
LSOI
local silicon-on-insulator
RMG
replacement metal gate
MuGFET
multigate field effect transistor
LPCVD
low-pressure chemical vapor deposition
WID
within-die
Wednesday, August 18, 2010
New 10 terms
SSL
strong segmentation limit
PEB
poly(ethylene-co-butadiene)
NDP
nonadecylphenol
MSA
methanesulfonic acid
PDP
pentadecylphenol
NR
neutron reflectivity
SLD
scattering length density
DSA
directed self-assembly
IRS
intermediate segmentation region
LWR
line width roughness
strong segmentation limit
PEB
poly(ethylene-co-butadiene)
NDP
nonadecylphenol
MSA
methanesulfonic acid
PDP
pentadecylphenol
NR
neutron reflectivity
SLD
scattering length density
DSA
directed self-assembly
IRS
intermediate segmentation region
LWR
line width roughness
Tuesday, August 17, 2010
New 10 terms
ITRS
International Technology Roadmap for Semiconductors
TBTDET
terbutylimidotris(diethylamido)tantalum
SMFD
synchronously modulated flow and draw
AVDP
alternating vapor deposition polymerization
VDP
vapor deposition polymerization
TC
terephthaloyl chloride
PD
p-phenylenediamine
GO
graphite oxide
ARPES
angle-resolved photoemission spectroscopy
WSL
weak segmentation limit
International Technology Roadmap for Semiconductors
TBTDET
terbutylimidotris(diethylamido)tantalum
SMFD
synchronously modulated flow and draw
AVDP
alternating vapor deposition polymerization
VDP
vapor deposition polymerization
TC
terephthaloyl chloride
PD
p-phenylenediamine
GO
graphite oxide
ARPES
angle-resolved photoemission spectroscopy
WSL
weak segmentation limit
Monday, August 16, 2010
New 10 terms
CDO
carbon-doped oxide
BTESM
bis(triethoxysilyl)methane
BTESE
1,2-bis(triethoxysilyl)ethane
HBPCSO
hyperbranched polycarbosilane
MB
methane-bridged
SEI
Science and Engineering Indicators
ACWA
Assembled Chemical Weapons Alternatives
EWG
Environmental Working Group
PTEC
Physics Teacher Education Coalition Conference
CTEC
Chemistry Teacher Education Coalition
carbon-doped oxide
BTESM
bis(triethoxysilyl)methane
BTESE
1,2-bis(triethoxysilyl)ethane
HBPCSO
hyperbranched polycarbosilane
MB
methane-bridged
SEI
Science and Engineering Indicators
ACWA
Assembled Chemical Weapons Alternatives
EWG
Environmental Working Group
PTEC
Physics Teacher Education Coalition Conference
CTEC
Chemistry Teacher Education Coalition
Thursday, August 5, 2010
New 10 terms
BMO
butadiene monoxide
EP
ellipsometric porosimetry
TEFS
triethoxyfluorosilane
DFL
dielectric flash layer
TMSNB
trimethoxysilylnorbornene
TESNB
triethoxysilylnorbornene
TCS
tetra(trimethoxysilylethyl)cyclotetrasiloxane
ILD
interlayer dielectric
OPL
organic planarization layer
PSZ
pure silica zeolite
butadiene monoxide
EP
ellipsometric porosimetry
TEFS
triethoxyfluorosilane
DFL
dielectric flash layer
TMSNB
trimethoxysilylnorbornene
TESNB
triethoxysilylnorbornene
TCS
tetra(trimethoxysilylethyl)cyclotetrasiloxane
ILD
interlayer dielectric
OPL
organic planarization layer
PSZ
pure silica zeolite
Monday, August 2, 2010
New 10 terms
DMTA
mechanical thermal analysis
MELT
modified edge lift-off test
BTESP
1,2-bis(trialkoxysilyl)ethane
FPB
four-point bending
DCB
double cantilever beam
HBCSO
hyperbranched carbosiloxane
HBPCS
hyperbranched polycarbosilane
USHC
unsaturated hydrocarbon
BCHD
bicyclohexadiene
CPO
cyclopentene oxide
mechanical thermal analysis
MELT
modified edge lift-off test
BTESP
1,2-bis(trialkoxysilyl)ethane
FPB
four-point bending
DCB
double cantilever beam
HBCSO
hyperbranched carbosiloxane
HBPCS
hyperbranched polycarbosilane
USHC
unsaturated hydrocarbon
BCHD
bicyclohexadiene
CPO
cyclopentene oxide
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